Save time by automating your Case Hardening Depth measurements and ensure repeatability without compromise!

透射电子显微镜(Transmission Electron Microscope，简称TEM)，可以看到在光学显微镜下无法看清的小于0.2 µm的细微结构，在材料科学、生物学上应用较多。由于电子易散射或被物体吸收，故穿透力低，样品的密度、厚度等都会影响到最后的成像质量。

The goal of materialographic preparation of welds is to have a consistent process where the analysis is performed in a reproducible manner. With this starting point for the analysis, the use of machine learning for automatic dimensional measurements on welded joints is now possible.

Are you looking to elevate your lab's weld macro preparation, improve accuracy, and streamline your workflow? Join us for an in-depth technical webinar, "Best Practices on Preparing of Weld Macros," on 7 October at 11 am BST.

随着电子设备的开发和生产技术的持续快速发展，对微电子试样制备与检测的要求越来越高。微电子器件试样具有体积小、结构复杂、试样制备精度要求高等特点。